Publications
Dimple Kochar, Tarun Samadder, Subhadeep Mukhopadhyay, Souvik Mahapatra, Modeling of HKMG Stack Process Impact on Gate Leakage, SILC and PBTI - IEEE International Reliability Physics Symposium (IRPS) 2021 [paper]
Dimple Kochar, Animesh Kumar, Estimation of Time to Failure Distribution in SRAM due to Trapped Oxide Charges - IEEE International Symposium on Circuits and Systems (ISCAS) 2021 (Poster) [paper]
Tarun Samadder, Nilotpal Choudhury, Satyam Kumar, Dimple Kochar, Narendra Parihar, Souvik Mahapatra, A Physical Model for Bulk Gate Insulator Trap Generation During Bias-Temperature Stress in Differently Processed P-Channel FETs - IEEE Transactions on Electron Devices (T-ED) [paper]